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Variable Angle Motorised Beam and Detectors
(nkd 8000 only)
X Y Mapping Stage
Multiple Angle Accessory
Detectors
Sample Inserts
Heated Sample Stage
Microspot Beam Delivery
Automatic Polariser
Rotation Stage
Pedestal with Industrial PC
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This option for the nkd – 8000 only,
provides the ability to measure thin films at angles of incidence from
0 to 90 degrees and from 20 to 70 degrees when measuring T and R
simultaneously. The transmitted light detector is mounted on the same
moving arm as the incident beam and therefore moves with it. The
reflected light detector is mounted on a separate mechanism and moves
at an angle equal to the incident beam or independently depending on
programming.
The variable angle option, which is fully computer controlled, is a
powerful feature for film thickness measurement - especially when films
are very thin and when the application requires a specific angle, such
as 37° for solar control films. It opens up the opportunity for
thin film measurement and characterisation of, beam splitters, laser
mirrors and complex coatings.
Fully automatic mapping of film
thickness and optical properties for samples up to 100x100mm is
possible with the X Y mapping platform. It is designed to provide
movement in both x and y whilst maintaining a clear aperture through
its center. The X Y stage features a set position for the calibration
sample and the system automatically moves to this position and
recalibrates before each measurement. The stage is fully motorised and
features an ultra compact robust design. A range of sample adaptor
inserts is available to suit most coating measurement applications.
Manual control of the stage is also possible.
The multiple angle option features a choice
of 3 fixed incident beam positions. These are 30, 50 and 70 degrees or
any customer specified angle. On the standard instrument a single fixed
angle of 30 degrees is provided. The multiple angle option is available
on all models, providing all the functionality you need for unambiguous
film thickness measurement.
Aquila supply a range of photodetectors,
covering the spectrum from 190nm to the mid infrared (Si, InGaAs, Pbs,
Ge, Thermopile). Their sturdy construction and innovative design,
enable excellent photometric performance, low noise and high
sensitivity for thin film measurement of AR coatings. Convenient
packaging allows standard optical accessories to be screwed to the
detector, such as lenses and filters.
Aquila manufacture a range of sample inserts
for convenient mounting of typical thin film samples. These include
specially designed holders for ophthalmic lenses and other highly
curved optical components.
Sample temperature control can be achieved
with the use of the heated sample chuck. And T and R spectra can be
measured over a range of temperatures.
This device focuses incident beam light down
to spot sizes of 250um, providing the capability to identify and
characterise thin films on very small areas. The Computer control
provides high precision focusing and as with all Aquila accessories,
its construction is robust and high quality. The microspot has
applications in pixel characterisation, small area thin film analysis
and the analysis of highly non-uniform thin films.
Select s-, p- or unpolarised incident light
with the click of a mouse, using the automatic polarisation selector.
Standard instruments have a manual dial for choosing the polarisation
state.
The rotation stage option is specifically
designed for very high accuracy, large or cantilever load applications
and can be used in OEM applications.
An optional bench/storage pedestal is
available for mounting the nkd system in a more industrial environment.
The PC supplied with a system having this option is an Industrial PC. A
convenient drawer is provided and there is adequate space for manual
and sample storage.
For full
specifications on al these components please contact Aquila.
 Accessories brochure
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