Complete thin film measurement

The Aquila nkd is used for a wide range of R & D appicaitons in academia and industry. A small selection of application notes are presented here for your interest. If you would like to discuss a particular thin film measurement applicaiton, please feel free to contact us.

The flexibility of the nkd makes it suitable for measuring the photometric performance, film thickness, refractive indices, absorption and uniformity of amongst others:

• Ophthalmic lenses• Sunglasses• Flat panel displays • Surface Coatings & Treatments • Polarising and dichroic coatings • Semiconductors • Telecoms components • Telecoms components • Electrodes & Sensors • CD & DVD optical systems • Solar control glass • Decorative materials • Packaging materials