Flexible thin
film measurement platform.
The
nkd-8000, is the most advanced design in our innovative range of
desktop thin film measurement systems, purpose built for enhanced
functionality and flexibility, to meet all your thin film analysis
requirements – from research to production and quality
control.
Non-destructive
determination of refractive index, extinction coefficient and film
thickness measurement, of single or multi-layer thin films and
substrates is achieved using the simultaneous measurement of
Transmittance and Reflectance spectra.
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